Planck-cmb-allsky

The Reset Switch Charge Decay Effect in JWST/MIRI Observations

October 2025 • 2025PASP..137j5002R

Authors • Ressler, Michael E. • Colbert, James W. • Laine, Seppo • Argyriou, Ioannis • Fox, Ori D. • Gordon, Karl D. • Guillard, Pierre • Labiano, Alvaro • Garcia Marin, Macarena • Morrison, Jane E.

Abstract • Blocked impurity band arsenic-doped silicon detectors such as those used in the James Webb Space Telescope's Mid-Infrared Instrument were invented in the 1980s to overcome many of the unwanted second-order effects found in the photoconductor detectors of that era. However, simply by virtue of operating the detectors at deep cryogenic temperatures (<10 K), non-ideal effects become inevitable, especially in the silicon readout integrated circuits that are hybridized with these detectors. Here, we describe a nonlinearity we have dubbed the Reset Switch Charge Decay effect. We discuss the physical origin and show the impact on both laboratory and flight data. Initial mitigation strategies show promise but are complicated by the fact that the magnitude of the effect depends on both the fluence and the flux of the incident signal, and the decay time appears to be readout speed dependent.

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IPAC Authors
(alphabetical)

James Colbert

Associate Scientist


Seppo_laine

Seppo Laine

Associate Scientist